Empirical Bayesian Strategy for Sampling Plans with Warranty under Truncated Censoring
出版日期：2016-08-04 00:00:00
著者：Tsai, Tzong-Ru; Lio, Y. L.; Chiang, Jyun-You
會議名稱：22nd ISSAT International Conference on Reliability and Quality in Design
會議地點：Los Angeles, USA
語言：en_US
會議性質：國際
校內研討會地點：無
研討會時間：20160804~20160806
國別：USA
出處：Proceedings of the 22nd ISSAT International Conference on Reliability and Quality in Design