出版日期：2016-03-26 00:00:00

著者：Tsai, Tzong-Ru; Lio, Y. L.

會議名稱：The 4th IIAE International Conference on Industrial Application Engineering 2016

會議地點：Beppu, Japan

摘要：In this paper, we study the merits and drawbacks of using the algorithm proposed by Tsai et al.(1) to obtain optimal sample size allocation and termination times of a twovariable constant-stress accelerated degradation test plan under the stochastic process of Gamma. A simulation example of light emitting diodes is used for illustrating the implementation of the algorithm.

關鍵字：Brownian motion process;Gamma process;geometric Brownian motion process;generalized Eyring model;inverse Gaussian distribution

語言：en

會議性質：國際

校內研討會地點：無

研討會時間：20160326~20160330

通訊作者：Tsai, Tzong-Ru

國別：JPN

出處：Proceedings of The 4th IIAE International Conference on Industrial Application Engineering 2016