Sensitivity analysis of sample allocation and measurement frequency under a degradation test with Gamma process
出版日期：2014-06-15 00:00:00
著者：J-Y Chiang; W-Y Sung; T-R Tsai; YL Lio
單位：統計學系暨研究所
會議名稱：Ninth International Conference on Innovative Computing Information and Control
會議地點：Busan, Korea
語言：zh_TW
研討會時間：2014/06/15~2014/06/18