出版日期：2023-03-04 00:00:00

著者：Wu, S.-J.; Huang, S.-R.; Wang, J.-H.

著錄名稱、卷期、頁數：Communications in Statistics - Theory and Methods 52(5), p. 1400-1416.

摘要：An important goal for the producers is to stimulate the purchase intention of consumers so that the profit can be increased. An attractive warranty policy can not only represent the quality of product but also enhance the purchase desire of consumers. A long warranty length usually stands for high quality. However, it is not suitable for the producers to provide an unlimited warranty length. The main purpose of this paper is to establish an approach to determine the optimal warranty length based on one-shot device sample. The one-shot device data are collected under a multiple-level constant-stress accelerated life test. The lifetime distribution at each stress level is assumed to be Rayleigh. A utility function is provided to measure the monetary profit based on a free-replacement warranty policy. The optimization problem is studied under the Bayesian framework. A numerical example is studied for illustrating purpose. Finally, the sensitivity analysis is performed to see the influence of some parameters on the optimal warranty length.

關鍵字：Accelerated life test;Bayesian approach;one-shot device testing;posterior predictive distribution;utility function

語言：en_US

ISSN：1532-415X; 0361-0926

期刊性質：國外

收錄於：SCI Scopus

通訊作者：Shuo-Jye Wu

審稿制度：是

國別：USA

出版型式：電子版,紙本