出版日期：2021-06-01 00:00:00

著者：Cheng-Hsun Wu;Tzong-Ru Tsai;Ming-Yung Lee

著錄名稱、卷期、頁數：IEEE Transactions on Reliability 70(2), p.446-458

摘要：Abstract—The parallel constant-stress accelerated degradation test (PCSADT) is a popular method used to assess the reliability of highly reliable products in a timely manner. Although the maximum likelihood (ML) method is commonly utilized to estimate the PCSADT parameters, the explicit forms of the ML estimators, and their corresponding Fisher information matrix are usually difficult to obtain. In this article, we propose a two-stage ML (TSML) estimation procedure for a time-transformed model. In the proposed procedure, all the TSML estimators not only have explicit expressions but also possess consistency and asymptotic normality. Hence, this method is tractable for reliability engineers. Furthermore, the TSML estimators can provide constructive information about the unknown accelerated relationship law. The proposed method is also applied to analyze light-emitting diode data and compare the performance of our estimation procedures with the ML method via simulations.

關鍵字：Accelerated relationship law;maximum likelihood estimation;parallel constant-stress accelerated degradation test;time-transformed model;two-stage estimation; Wiener process.

語言：en_US

ISSN：0018-9529;1558-1721

期刊性質：國外

收錄於：SCI Scopus

審稿制度：是

國別：USA

出版型式：電子版,紙本