Discussion of “Assessing the Goodness of Fit of Logistic Regression Models in Large Samples: A modification of the Hosmer-Lemeshow test,” by Giovanni Nattino, Michael L. Pennell, and Stanley Lemeshow
出版日期:2020-04-06 00:00:00
著者:Li-Ching Chen; Jiun-Yi Wang
著錄名稱、卷期、頁數:Biometrics 76(2), p.569-571
語言:en_US
期刊性質:國外
收錄於:SCI
審稿制度:是
國別:USA
出版型式:電子版,紙本