出版日期：2020-05-01 00:00:00

著者：Wu, S.-J.; Hsu, C.-C.; Huang, S.-R.

著錄名稱、卷期、頁數：Reliability Engineering and System Safety, Vol. 197, Article 106795, pp. 1-8

摘要：In this paper, we investigate some statistical inference, optimal design, and reliability sampling plan problems related to multiple constant-stress accelerated life test with one-shot device testing. At each stress-level combination, a generalized exponential lifetime distribution is considered. The scale parameter of the proposed distribution is assumed to be a log-linear function of stresses. To conduct a one-shot device accelerated life test more efficiently, one has to address the problem of determining optimal setting that produces the best estimation results. In practice, the experimental budget is always limited. The size of budget usually influences the decision of experimental setting and hence, influences the precision of estimation. Therefore, this paper is to determine the optimal experimental setting under D-optimality criterion with cost constraint. In addition, reliability sampling plan is an important statistical tool in the area of quality control. This paper is also to explore the optimal reliability sampling plan which minimizes the total experimental cost of a one-shot device accelerated life test with specified producer’s risk and consumer’s risk.

關鍵字：Acceptance sampling;Cost minimization;D-optimality;Generalized exponential distribution;Maximum likelihood method

語言：en

ISSN：0951-8320

期刊性質：國外

收錄於：SCI EI

通訊作者：Wu, S.-J.

審稿制度：是

國別：USA

出版型式：電子版,紙本