Estimation of the parameters and expected test time of exponentiated Weibull lifetimes under type II progressive censoring scheme with random removals
出版日期：2019-03-01 00:00:00
著者：Fathy H. Eissa; Shuo-Jye Wu; Hamid H. Ahmed
著錄名稱、卷期、頁數：International Journal of Statistics and Probability 8(2), p.124-139
摘要：Based on progressive type-II censored sample with random removals, point and interval estimations for the shape parameters of the exponentiated Weibull distribution are discussed. Computational formula for the expected total test time are derived for different situations of sampling plans. This is useful in planning a life test experiment. The efficiency of the estimators are compared in terms of the root mean square error, the variance and the coverage probability of the corresponding confidence intervals. A simulation study is presented for several values of removal probability and different values of failure percentage. Also, numerical applications are conducted to illustrate and compare the usefulness of the different sampling plans in terms of expected test times for different patterns of failure rates.
關鍵字：progressive type-II censoring;random removals;maximum likelihood estimation;confidence interval;coverage probability;expected test time;exponentiated Weibull model
語言：en
ISSN：1927-7032
期刊性質：國外
通訊作者：Eissa, F. H.
審稿制度：是
國別：CAN
出版型式：電子版