出版日期：2008-10-01 00:00:00

著者：蔡宗儒; Tsai, Tzong-ru; 呂玉婷; Lu, Yu-ting; 吳碩傑; Wu,S huo-jye

單位：淡江大學統計學系

出版者：Elsevier

著錄名稱、卷期、頁數：Computers and Industrial Engineering 55(3), pp.721-728

摘要：This paper establishes reliability sampling plans for the Weibull lifetime distribution based on type II censored data with limited capacity of test facility. The products are sold under a general rebate warranty policy. It is also assumed that the shape parameter of the lifetime distribution is known, and the scale parameter is a random variable varying from lot to lot. A cost model is established which contains the cost per unit on test, the cost per unit time for life test, and the costs of rejecting and accepting a unit. An algorithm for determining the optimal reliability sampling plans which minimize the expected average cost per lot is provided. Some numerical results to illustrate the use of the proposed method are studied.

關鍵字：Acceptance sampling;Posterior distribution;Prior distribution;Type II censoring;Warranty policy

語言：en

ISSN：0360-8352

期刊性質：國外

收錄於：SCI EI

審稿制度：否

國別：GBR

出版型式：電子版,紙本