出版日期：2008-09-04 00:00:00

著者：Huang, S.-R.; Wu, S.-J.

著錄名稱、卷期、頁數：IEEE Transactions on Reliability 57(3), p.445-451

摘要：This paper gives a reliability sampling plan for progressively type I interval censored life tests when the lifetime follows the exponential distribution. We use the maximum likelihood method to obtain the point estimation of the parameter of failure time distribution. We provide an approach to establish reliability sampling plans which minimize the total cost of life testing under given consumer's and producer's risks. Some numerical studies are investigated to illustrate the proposed approach.

關鍵字：exponential distribution;failure analysis;life testing;maximum likelihood estimation;reliability theory;sampling methods

語言：en_US

ISSN：0018-9529

期刊性質：國外

收錄於：SCI EI

通訊作者：Wu, S.-J.

審稿制度：是

國別：USA

出版型式：電子版,紙本