出版日期：2008-09-01 00:00:00

著者：Wu, J. W.; Lee, H. M.; Lei, C. L.

單位：淡江大學統計學系

出版者：London: Sage Publications Ltd.

著錄名稱、卷期、頁數：Journal of Engineering Manufacture 222(12), pp.1729-1739

摘要：Process capability indices are used to measure the potential and performance of a process. This study constructs a uniformly minimum variance unbiased estimator (UMVUE) of the lifetime performance index based on the upper record values for a one parameter exponential lifetime model. The UMVUE of the lifetime performance index is subsequently utilized to develop a hypothesis testing procedure for the condition of a known lower specification limit. Finally, three examples and a Monte Carlo simulation are presented to assess the behaviour of this test statistic for testing the null hypothesis under given significance levels. Product managers can use the proposed testing procedure to determine whether or not a process adheres to a required level of performance.

關鍵字：process capability indices;exponential distribution; upper record values;UMVUE;Monte Carlo simulation

語言：en

ISSN：0954-4054; 2041-2975

期刊性質：國外

收錄於：SCI EI

通訊作者：Wu, J-W

國別：GBR

出版型式：紙本