出版日期：2009-12-01 00:00:00

著者：Tsai, Tzong-Ru; Lin, Chin-Wei; Chen, Chiu-Ling; Huang, Sheng-Bang

單位：淡江大學統計學系

出版者：Kumamoto: ICIC International

著錄名稱、卷期、頁數：ICIC Express Letters 3(4)pt.B, pp.1471-1476

摘要：This paper provides a simple estimation procedure to evaluate the mean life to failure of high power light emitting diodes. An experiment of accelerated degradation test with high power light emitting diodes is conducted lasting 9022 hours. Degradation paths are collected and used to illustrate the proposed method. The example indicates that the proposed method works well, and it is easy to operate to engineers.

關鍵字：Degradation test;Inverse Gaussian distribution;Light emitting diodes;Lumen maintenance;Wiener Process

語言：en

ISSN：1881-803X

期刊性質：國外

收錄於：EI

通訊作者：Tsai, Tzong-Ru

國別：JPN

出版型式：紙本