出版日期：2023-11-14 00:00:00

著者：Peihua Jiang; Bingxing Wang; Xiaofei Wang; Tzong-Ru Tsai

著錄名稱、卷期、頁數：IEEE Transactions on Reliability 73(2), p.967-977

摘要：An inverse Gaussian step-stress accelerated degradation test model was put forward, in which the drift and shape parameters are functions of the stress levels. The confidence intervals of the model parameters and some reliability measures, such as the mean lifetime, the reliability function, and the pth percentile under the rated usage stress, are presented. The online and offline remaining useful life prediction intervals under the rated usage stress level are also acquired. Simulation technologies are used to examine the effect of the presented interval estimation approaches. Simulation results manifest that the presented interval estimation method performs well in all cases. Finally, a case study is provided to illustrate our inference approaches.

語言：en

ISSN：0018-9529; 1558-1721

期刊性質：國外

收錄於：SCI

審稿制度：否

國別：USA

出版型式：電子版,紙本